Abstract
The electrical properties and kinetic dependences of thermally induced drift of electrical resistance in eco-friendly single- and multilayer temperature-sensitive thick-film structures based on Cu0.1Ni0.1Co1.6Mn1.2O4 (with p+-type electrical conductivity) and Cu0.1Ni0.8Co0.2Mn1.9O4 (with p-type of electrical conductivity) ceramics for multisensor nanosystems. It has been established that in the p- and p+-type thick films the processes of burning out the residues of the organic bond between grain spinels and simultaneous penetration of metallic silver into the space are activated. Such processes are described by a compressed exponential-power relaxation function. Thick-film p+-p structures are characterized by own aging processes, which manifest themselves in an increase in electrical resistance. Kinetics of their thermally-induced aging is adequately described by an extended exponential-power function.
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