Electrical properties and structure of alloys of the Cu?In?Al system

Abstract

1. With an atomic fraction of copper less than 67–68%, inclusions of pure indium are observed in the alloy. 2. In alloys with atomic fractions of indium less than 15% there is a series of reversible phase reactions. At 740°C β+δ⇆γ is observed, at 675°C α+δ⇆β2+δ transformation is observed, and close to 560°C eutectoid α+γ2⇆β1+α -transformation occurs. 3. Anomalies at 160°C in the temperature dependence curves for internal friction and electrical resistivity in alloys with an atomic fraction of indium greater than 15% are due to a change in the aggregated condition of inclusions. 4. An increase in the content of indium inclusions leads to deterioration of test alloy properties, in particular microhardness is H 1200–1300 (for alloy with an atomic fraction of indium of 25%), which is typical for brittle materials.