Electrical Failure Mechanism in Stretchable Thin-Film Conductors.

Abstract

Stretchable thin-film conductors are basic building blocks in advanced flexible and stretchable electronics. Current research mainly focuses on strategies to improve stretchability and widen the range of applications of stretchable conductors. However, stability should not be neglected, and the electrical failure mode is one of the most common stability issues that determines the current range and duration in a circuit. In this work, we report the electrical failure mechanism of stretchable conductors. We find a special failure mode for the stretchable conductors, which can be attributed to the coupling effect between local thermal strains and dynamic resistance changes of the thin film. This creates a vicious circle that significantly differs from traditional conductors. Physical parameters related to this special failure mode are investigated in detail. It is found that this mechanism is applicable to different kinds of stretchable conductors. Based on this finding, we also explore methods to modulate the failure of stretchable conductors. The failure mechanism found here provides a fundamental understanding of the current effect of stretchable circuits and is crucial for designing stable stretchable bioelectrodes and circuits.