Abstract

Thin films of carbazole have been prepared using vacuum evaporation technique. The electrical conductivity studies are carried out in both low and high temperature regions and the activation energies have been determined. In the low temperature region the electrical conduction is due to hopping of charge carriers in a coulomb gap. Carbazole thin films have been used to fabricate capacitors and the variation of capacitance, dielectric constant; conductivity and dielectric loss in the frequency range between 100 Hz and 3.16 MHz are investigated. The effect of annealing on the dielectric properties is also investigated. The surface topography of the deposited films is studied using scanning electron microscopy. Film morphologies are found to change by annealing.

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