Abstract
A bulk platinum microelectrode calibration method, aiming at providing reliable measurements of the electrical properties of thin solid electrolyte films, is described. The method consists in the determination of the electrically active surface of an electrode of microscopic dimensions based on the confident measurement of the conductivity of a well know reference sample. The method is demonstrated to be efficient, reliable and reproducible in the case of yttria-stabilized zirconia films prepared by different techniques for films thicknesses ranging from 1.5 µm to 10 µm.
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