Electrical characteristics of an X-ray photoelectron spectrometer

Abstract

Current-voltage characteristics have been measured for an AEI ES200B X-ray photoelectron spectrometer with both conducting and insulating samples. With the conducting sample, the flux of secondary electrons falling on the specimen and probe amounts to approximately 20 percent of the photoelectron flux, over a wide range of irradiation conditions. The results for the insulating sample, taken in conjunction with subsidiary data from charging shifts, indicate that the secondary flux incident on the specimen alone exceeds 99 percent of the photoelectron flux.