Abstract

Double-layer Ag/NaCl(s)/NaCl(p)/Ag capacitors consisting of a single-crystal and a polycrystalline film both produced by vacuum evaporation were investigated. In such capacitors the breakdown field F B shows no dependence on the thickness d of the dielectric for the negatively biased single-crystal electrode, but decreases slightly with decreasing d on reversing the polarity. We suggest two possible explanations for this behaviour: 1. (1) the two dielectric layers may have different work functions, resulting in a change in the potential distribution at their interface as well as in the conditions at the electrode-dielectric interface and thereby leading to the occurrence of breakdown under complex field conditions; 2. (2) the breakdown may be influenced by the conditions of orientation of the crystallites at the interface of the two layers, thus affecting the direction of the breakdown channel.

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