Abstract
Double rare-earth (La; Sm/Gd) substituted Aurivillius family of Bismuth Layered Structured Ferroelectrics (BLSF) namely Bi2.6Sm0.2La0.2TiNbO9 (BSLT; sample-A), Bi2.6Gd0.2La0.2TiNbO9 (BGLT; sample-B), single phase ceramics were prepared by solid state route. In addition, intergrowth (x BSLT - (1-x) BGLT, where x=0.49; sample-C) and solid solution (BSLTx - BGLTy; where x + y=0.4; sample-D) materials were prepared. Dielectric, ferroelectric and Raman spectroscopic properties were studied on the said above materials. The X-ray diffraction analysis and Raman spectra revealed well-formation of stable structure. Though, the sample-C and sample-D have lower coercive field, compared to the sample-A and sample-B, but they exhibited sharp hysterisis loop. Therefore the instrinsic defects of sample-D inhabits more sensitivity towards the ferroelectric behaviour. The results were corroborated to the impedance and dielectrical data. The results were consistent with the SEM micrographs and complex impedance plots. An attempt is made to understand the effect of rare-earth ions on A-site of layered-pervoskite structure, defined as: (Bi2O2)2+(An-1BnO3n+1)2-.The term n represents number of pervoskite blocks interleaved with the bismuth oxide layers.
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