Abstract

Transparent conducting thin films of indium tin oxide (ITO) have been deposited by d.c. reactive planar magnetron sputtering by using metal InSn alloy target in an ArO 2 gas mixture. The study demonstrates that the deposition on unheated substrates achieved sheet resistance of as low as about 50–60 Ω/□ (or a resistivity of abouts 7 × 10 −4 Ω cm), and visible transmission of about 90% for a wavelength of 420 nm. The effects of heat treatment at 450 °C in air depends on the deposition conditions of the as-deposited ITO films. Although annealing improves the properties of as-deposited ITO films which were deposited with non-optimum conditions, the optimized condition for the formation of the film in the as-deposited state is essential to obtain a high quality transparent conducting coating.

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