Abstract

Optical transmission spectra, microcathodoluminescence spectra, capacitance–voltage and capacitance–frequency curves, temperature dependence of resistivity and deep level spectra with both electrical and optical injection were measured on n-GaN samples implanted with high doses of Mn (3×1016 and 4×1016 cm−2) and Co (4×1016 cm−2). From optical transmission it was found that Mn forms a deep acceptor near Ev+1.8 eV while the Co acceptor is about 0.1 eV deeper. In addition, Mn and Co form complexes with native defects and these complexes are deep electron traps with a level near Ec−0.5 eV. Such complexes are most likely responsible for a strong blue luminescence band with energy near 2.9 eV. Adjacent to the implanted region a defect region about 1 μm deep is formed, most likely by out-diffusion of point defects from the implanted zone during the 700 °C annealing used to partially remove the radiation damage. This region is characterized by a high density of electron traps at Ec−0.25 eV and Ec−0.7 eV and hole traps at Ev+0.2 eV, Ev+0.35 eV and Ev+0.45 eV.

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