Abstract
AbstractIt is well known that mechanical properties of Shape Memory Alloys are strongly dependent upon the test temperature (T) respect to transformation temperatures: the stress-strain curves however hinder the true deformation processes acting.Electrical resistance(ER), a physical property sensibly affected by electronic structure modifications, traditionally used to follow the growth of thermal martensite, is here investigated to follow the modifications of a NiTi alloy, in an initial single phase structure, under applied stress. ER measurements are here detected with the aim to distinguish different deformation processes at four test temperatures Ti (i=1,..,4): in martensitic phase,either at T1 <Mf or at T2<As within the hysteresis cycle; in parent phase, either at Af<T3 or at Ms<T4 within the hysteresis cycle, where T2 = T4. Results are examined in comparison with previous obtained data and discussed at the light of imprinted deformation.
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