Abstract
In this work, we present the optimized principal methods of surface cleaning and treatment for CdTe nuclear detectors, namely: powder lapping, polishing and chemical etching mainly by Br- Methanol. We have studied the electric field mapping by Pockels effect technique. We made a comparison between the three main methods of Pt contact deposition: molecular beam epitaxy, cathode sputtering and the electroless (autocatalytic) methods in term of I(V) characteristic and electric field mapping. The two first method show: i) quite high uniform electric field, ii) the characteristic I(V) is non-uniform, iii) the detection suffer from the polarization effect. The I (V) characteristic shows that the contact is not ohmic. It is in the reversible I ∼ Vn with n varying from 0.643 to 1.651. The optimized contact deposit by electroless technique seems to be the more suitable one for detection with 2.10−8 A current at 200 V, a quite high uniform electric field up to 7 kV/cm, an absence of polarization effect and a spectrometric quality of nuclear detection.
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