Abstract
AbstractDistributions of charged species over metal oxide appearing after a step‐like voltage bias application and under the alternate voltage respectively are examined in framework of the diffusion initial‐boundary value problem. When possible, the solutions are derived in analytical form to make general conclusions. The solutions obtained are helpful in particular to ascertain limits of the diffusion approach to explain the transient behavior of non‐linear electric potential distributions over gas sensitive metal oxide films and the low‐frequency abnormalities of impedance spectra of such films.
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