Electric field imaging of single atoms

Naoya Shibata,Gabriel Sánchez-Santolino,Yuichi Ikuhara,Ryo Ishikawa,Scott D Findlay,Yuji Kohno,Takehito Seki,Takao Matsumoto

doi:10.1038/ncomms15631

Naoya Shibata, Gabriel Sánchez-Santolino + Show 6 more

Open Access

https://doi.org/10.1038/ncomms15631

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Abstract

In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors. Recently, it has been shown that the atomic-scale electric field of both the positive atomic nuclei and the surrounding negative electrons within crystalline materials can be probed by atomic-resolution differential phase contrast STEM. Here we demonstrate the real-space imaging of the (projected) atomic electric field distribution inside single Au atoms, using sub-Å spatial resolution STEM combined with a high-speed segmented detector. We directly visualize that the electric field distribution (blurred by the sub-Å size electron probe) drastically changes within the single Au atom in a shape that relates to the spatial variation of total charge density within the atom. Atomic-resolution electric field mapping with single-atom sensitivity enables us to examine their detailed internal and boundary structures.

Highlights

In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors
Single-atom imaging by an electron microscope was first realized by Crewe et al.[1] using scanning transmission electron microscopy (STEM), and STEM developments have pursued direct single-atom imaging with higher resolution and sensitivity ever since[2,3]
One advantage is the availability of simultaneous, complementary signals during Differential phase contrast (DPC) STEM imaging that facilitate the characterization of local atomic structures and chemical information from exactly the same area

Summary

Introduction

In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors.

Results

Conclusion