Electric-Field-Controlled Interface Exchange Coupling in Cobalt–Chromia Thin Films

Abstract

First-principle calculations are used to determine the interface exchange coupling in cobalt–chromia thin films as a function of the electric field. Both bilayer Co/Cr2O3 and trilayer Co/Pt/Cr2O3 are investigated. The sign and magnitude of the interface exchange depend on the thickness of the cobalt layer, and oscillatory sign changes of the interface exchange are found in the trilayer system. The electric field dependence of the exchange may be exploited in voltage-controlled spin-electronics applications.