Abstract
Abstract : Elastic properties are of fundamental interest in condensed matter physics, material science, geoscience, and many branches of engineering. This paper describes the use of a relatively new technique, known as 'Resonant Ultrasound Spectroscopy' (RUS), with which the elastic properties of a small sample may be found in a single measurement, by analyzing a sufficient number of the sample's normal modes of free vibration. The present work describes the use of polyvinylidene (PVDF) thin-film transducers to extend the above method to very small -100 micrograms, fragile samples. The method is calibrated by measuring the elastic constants of a well-characterized material, cubic silicon. Measurements and analyses of several novel materials, including spherical ceramic particles ('proppants') and an aluminum alloy 'quasicrystal', are subsequently presented. Second-order perturbations of the normal mode frequencies due to minor sample preparation errors are also discussed.
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