Elaboration and characterization of nanocrystalline TiO2 thin films prepared by sol–gel dip-coating

Abstract

Nanocrystalline TiO2 thin films were deposited on a ITO coated glass substrate by sol–gel dip coating technique, the layers undergo a heat treatment at temperatures varying from 300 to 450°C. The structural, morphological and optical characterizations of the as deposited and annealed films were carried out using X-ray diffraction (XRD), Raman spectroscopy, Atomic Force Microscopy (AFM), visible, (Fourier-Transform) infrared and ultraviolet spectroscopy, Fluorescence and spectroscopic ellipsometry. The results indicate that an anatase phase structure TiO2 thin film with nanocrystallite size of about 15nm can be obtained at the heat treatment temperature of 350°C or above, that is to say, at the heat treatment temperature below 300°C, the thin films grow in amorphous phase; while the heat treatment temperature is increased up to 400°C or above, the thin film develops a crystalline phase corresponding to the titanium oxide anatase phase. We have accurately determined the layer thickness, refractive index and extinction coefficient of the TiO2 thin films by the ellipsometric analysis. The optical gap decreases from 3.9 to 3.5eV when the annealing temperature increases. Photocatalytic activity of the TiO2 films was studied by monitoring the degradation of aqueous methylene blue under UV light irradiation and was observed that films annealed above 350°C had good photocatalytic activity which is explained as due to the structural and morphological properties of the films.