Einflu� der Kristalltemperatur auf die Intensit�ten dynamischer Elektroneninterferenzen

Abstract

The temperature dependence of dynamically influenced electron diffraction intensities of a polycrystalline aluminium foil was measured by means of a retarding field apparatus in the temperature range 150–800°K. It is shown, that the observed temperature behaviour of these reflections (g) can be described by effective Debye Waller factors exp(- αM)g, which are in good agreement with calculations, based on the dynamical theory of electron diffraction.