Abstract
A new experimental technique in which direct photographs of two reciprocal planes are taken simultaneously is described. The method combines the advantages of the precession method (a series of reciprocal planes is accessible with the adjustment of a single reciprocal direction) and the de Jong Bouman method (high diffraction angles are possible). Consequently many crystals (e.g. organic ones) may be measured with copper radiation without loss of information. The advantages of the new method and the final construction for practical X-ray diffractometry are discussed.
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