Abstract
Eigenvalue analysis of open curved geometries is performed by using a two dimensional (2-D) Finite Difference Frequency Domain (FDFD) eigenvalue method employing orthogonal curvilinear coordinates, in conjunction with a perfectly matched layer (PML) tensor. This method can be used to compute the dispersion characteristics of open curved structures such as open microstrip lines printed on curved substrates. Numerical results for the eigenvalues of several geometries are presented, and compared against already published results, so as to validate the accuracy of the method.
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