Abstract
A method for joint transmission line and aperture field integration (TL-AFIM) is proposed and utilized to efficiently compute the near-field distribution of the finite-sized multilayered dielectric plates. Four indicators Epv, Erms, φpv, and φrms representing the amplitude and phase variations are proposed to evaluate the near-field uniformity. A multilayered dielectric plate containing three dielectric layers is analyzed and evaluated by TL-AFIM. Compared to the commonly used multilevel fast multipole method (MLFMM), the memory requirement and CPU time consumption are drastically reduced from 61.3 GB and 20.2 h to 4.4 MB and 2.5 s, respectively. The calculation accuracy is better than 90%.
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