Abstract

In the industry of polymer film products such as polarizers, measuring the three-dimensional (3D) contour of the transparent microdefects, the most common defects, can crucially affect what further treatment should be taken. In this paper, we propose an efficient method for estimating the 3D shape of defects based on regression by converting the problem of direct measurement into an estimation problem using two-dimensional imaging. The basic idea involves acquiring structured-light saturated imaging data on transparent microdefects; integrating confocal microscopy measurement data to create a labeled data set, on which dimensionality reduction is performed; using support vector regression on a low-dimensional small-set space to establish the relationship between the saturated image and defects’ 3D attributes; and predicting the shape of new defect samples by applying the learned relationship to their saturated images. In the discriminant subspace, the manifold of saturated images can clearly show the changing attributes of defects’ 3D shape, such as depth and width. The experimental results show that the mean relative error (MRE) of the defect depth is 3.64% and the MRE of the defect width is 1.96%. The estimation time consumed in the Matlab platform is less than 0.01 s. Compared with precision measuring instruments such as confocal microscopes, our estimation method greatly improves the efficiency of quality control and meets the accuracy requirement of automated defect identification. It is therefore suitable for complete inspection of products.

Highlights

  • Polarizers are core components of thin film transistor–liquid crystal display (TFT-LCD) panels widely used in display screens for products such as computers, mobile phones, digital cameras, and televisions

  • In our previous studies [7,13,14,15], we have focused on an imaging mechanism for transparent microdefects, such as dents and bumps, and proposed a so-called saturated imaging method to obtain high-contrast defect images

  • The results demonstrate the effectiveness of the proposed method for a small number of collected samples

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Summary

Introduction

Polarizers are core components of thin film transistor–liquid crystal display (TFT-LCD) panels widely used in display screens for products such as computers, mobile phones, digital cameras, and televisions. Typical polarizers are approximately 0.3 mm thick and composed of six transparent polymer films. Polarizers are prone to aesthetic defects such as impurities, scratches, stains, bubbles, dents, and residual glues. These defects may exist in any layer of a film, degrading the quality of the liquid crystal panels or even causing them to fail. With the increasing application of machine vision and artificial intelligence in factory automation, numerous engineering-based practices for TFT-LCD industry and film defect detection have emerged [1]

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