Abstract

Photoelectrochemical (PEC) water splitting performed by an electrocatalyst integrated with a semiconducting photoelectrode is advantageous with improvements in both charge-transfer kinetics and interface energetics because of the electrocatalyst/semiconductor junction. In general, interface energetics has been considered to arise from differences in the intrinsic electronic energy levels between the electrocatalyst and the semiconductor. Here, we demonstrated that when a NiOx thin film with porous and nanocrystalline structures is integrated with a Si photoelectrode, the interface energetics is developed by an electrochemical energy level extrinsically formed by the pseudocapacitive surface reaction (a redox reaction of NiOx for electrochemical charge storage). This new type of junction, named a pseudocapacitive NiOx/Si junction, revealed two intriguing features: the interface energetics is dynamically changed as charging/discharging progresses, and the developed electrochemical energy level and the elect...

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