Abstract
A novel method is proposed to measure the thickness of the indium tin oxide (ITO) film, which is less than 20 nm, using valid Fourier’s phase information of white light correlogram and curve matching algorithm. Based on the Fourier transform amplitude information, the valid phase distribution function that contains the thin transparent electrode ITO film thickness information has been successfully extracted. A curve matching algorithm based on standard deviation is employed to accurately calculate the thickness of such thin ITO films. The experimental results show that the thickness values were consistent with that determined using the stylus instruments, indicating that this method can be applied to measure the ITO film thickness ranging from 5 to 100 nm.
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