Abstract
We present a novel characterization method for semiconductor optical amplifier Mach-Zehnder interferometer (SOA-MZI) switches which combines a pump-probe measurement with an interferometer bias scan. In addition to a wealth of information on the switching dynamics for all operating points of the switch, we can create an extinction map to pinpoint regions of highest extinction for optimizing all-optical ultrafast switching. We experimentally verify the accuracy of this characterization method by performing a wavelength characterization at the optimal bias point and a nearby, non-optimal point. A 1-dB penalty was observed.
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