Abstract
This paper describes the unique hardware features designed in a traditional hardware Algorithmic Pattern Generator (APG) to make full functional Direct Access Testing (DAT) of embedded memories with different data widths easier in a high volume production environment. The APG support software enables the encapsulation of pattern design for various sizes of embedded memories or arrays to significantly reduce the pattern complexity and generation effort.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
