Abstract
Large-signal models for microwave devices are classically derived via a small-signal detour using S-parameter measurements. Due to the recent advances in the metrology area of vectorial large-signal measurements, several novel modelling methodologies circumventing this small-signal detour are being developed. An important aspect that these methods have in common is the minimisation of the number of required measurements. As in the case of S-parameter measurements, the goal of the large-signal measurements is to adequately cover the predefined operating region of the device-under-test. In this work, we present a method that enables us to automatically calculate the excitation signals to be applied in order to efficiently cover the (V/sub 1/, V/sub 2/) voltage plane of two-port microwave devices. We illustrate this method on a HEMT, where we obtained a significant (>90%) reduction in measurements. Finally, we show that this limited set of vectorial large-signal measurements is sufficient to construct an accurate time-domain behavioural model.
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