Efficient and accurate measurement of very sharp crystallographic textures: A new measurement strategy

Abstract

A new measurement strategy is introduced to determine very pronounced crystallographic textures of polycrystalline materials most accurately and efficiently. It features optimized adaptively refined successive X-ray pole figure measurements. To optimize both the total experimental time as well as the angular resolution, and thus the accuracy of pole figure measurements, traveling salesman problems on the hemisphere of poles have to be resolved. The corresponding algorithm is encoded and implemented as part of the software controlling the texture goniometer. The procedure was applied to pole figure measurements of a NiW alloy with extremely sharp Cube texture. The results are presented and compared to conventional measurement strategies.