Abstract
Frequency selective surfaces (FSS) operating in the microwave and millimeter-wave region may consist of either a periodic array of apertures in a metal screen (inductive FSS) or a periodic array of patches on a dielectric layer (capacitive FSS). We have proposed an efficient algorithm for the analysis of inductive FSS, both in the case of thin and in the case of thick metal screens. This algorithm is named the MoM/BI-RME method and is based on the method of moments (MoM) applied with entire-domain basis functions, which are very efficiently calculated by the boundary integral-resonant mode expansion (BI-RME) method. In this paper, we present the application of the MoM/BI-RME method to the analysis of capacitive FSS. The patches may have an arbitrary shape, and losses in both the dielectric medium and the conductors can be accounted for.
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