Abstract

Since its unique advantages in the trade-off between data acquisition rate and hardware cost, the scanning 1D multiple-input-multiple-output (MIMO) array setup has been widely used in nondestructive testing (NDT) applications, especially for product quality control on the assembly line. In this article, two fast fully focused algorithms based on scanning 1D MIMO array are developed for imaging half-space medium structures. Both of the algorithms are derived under the half-space Green's function, and are implemented through fast Fourier transform (FFT) and phase compensation. The only difference between these two algorithms is that the matrix multiplication and nonuniform FFT (NUFFT) are respectively employed to reconstruct the range profile. Simulation and experimental results verify the effectiveness of the proposed algorithms in computation efficiency and image reconstruction quality.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call