Efficiency and resolution characterisation of a high-resolution bent crystal X-ray spectrometer using ray-tracing simulations

Abstract

We report the characterisation of the efficiency and resolution of a high-resolution bent crystal spectrometer under Johannson geometry, using ray-tracing simulations. The spectral resolution is measured experimentally from electron-beam and fast ion-beam interactions with thin solid foils. The X-rays emitted by target atoms as well as projectile ions are studied. The results of the ray-tracing simulations are in very good agreement with the beam-foil spectroscopy experiments. The geometrical factors affecting the resolution are also discussed in detail. We also characterise the detection efficiency of the spectrometer by simultaneous measurements of X-rays using a semiconductor detector, i.e. Si(Li) detector, with known detection efficiency. These results are also compared with the ray-tracing simulation results.