Abstract

To satisfy the development of MLCC devices, the dielectric properties and temperature stability of ceramic materials urgently needs to be improved. In our work, the 0.9BaTiO3-0.1Bi(ZnxMg0.5-xY0.5)O2.75 ceramics with x=0.0–0.5 are successfully prepared based on a traditional solid-state method. Meanwhile, the ceramic sample (core-shell structure) with x = 0.1 exhibits excellent dielectric properties and temperature stability (εr: 1207, tanδ: 0.009 and εr/ε25 ≤±15% within −80 to 200 °C), which satisfies the Electronic Industries Association (EIA) X9R (-55–150 °C, Δεr/ε25 ≤±15%) specification. In addition, the physical mechanism behind dielectric properties and temperature stability is systematic investigated based on experimental characterization and the first-principle calculations. The interface polarization is regarded as the primary cause affecting the dielectric properties, and has a close relationship with shell structure of ceramic samples. The lattice deformation of shell structure is caused by the introduction of heterovalent ions and non-equivalent substitution. Dielectric constant may be advance as content of Zn2+ ions increases due to the electronic enrichment around the zinc site in distorted lattice matrix. However, the weaken force between atom and electron results in the poor temperature stability.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call