Abstract
AbstractDopants Y and Zr at 100 ppm levels in high purity, micron grain-size polycrystalline alumina are mainly segregated to the alumina grain boundaries and strongly reduce high temperature creep. Information about this segregation has come from high resolution STEM composition mapping experiments. Information about local structural surroundings of the dopant atoms has come from EXAFS experiments, and information about local bonding of the dopant atoms has come from XANES experiments. Structural models for dopant grain boundary segregation provide a context for these experimental results and for effects of dopant incorporation on grain boundary mediated transport. Recent experimental and theoretical results are discussed in this paper.
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