Abstract

This paper presents formulae for system mean life, variance of time to failure, hazard rate and reliability of parallel, k-out-of-n, parallel-series and bridge networks with common cause failures. The components in every configuration are assumed to be identical and characterized by a Weibull time to failure density function. The graphical plots of the system reliability and mean life gain are shown.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.