Abstract
Quartz electrodiffused (swept) in an air or vacuum atmosphere, or irradiated with 60Co, is characterized using low temperature infrared Fourier spectroscopy, and peaks associated with as-grown hydroxide and aluminum hydroxide point defect centers are measured. The distribution of hydroxide related defect centers along the z-growth or sweeping axis for high quality quartz is determined from scanning small crystal regions normal to the axis.
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