Abstract
The surface structure and electrical properties of titanium-doped indium oxide (ITiO) films prepared by RF magnetron sputtering were investigated. The doping concentration of TiO2 in the In2O3 target was changed from 1.0 wt.% to 10.0 wt.% with increments of 1.0 wt.%. At a Ti content of 5.0 wt.%, the optimum growth conditions were achieved. The finest value of hall mobility, carrier concentration, and resistivity of the deposited film reached 47.03 cm2Ns, 1.148 x 10(21) cm-3 and 1.14 x 10(-4) Ωcm, respectively. Then the transmittance was achieved up to 82% at 570 nm. The peaks of the XRD spectra became more intense and sharp as the Ti concentration increased up to 2.5 wt.% but a higher Ti content of 10.0 wt.% retarded a growth of In2O3 grains. The surface roughness of the films by examination of surface morphology using AFM also rose with increase of Ti doping concentration.
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