Effects of thermal history on the rigid amorphous phase in poly(phenylene sulfide)

Abstract

The rigid amorphous phase of semicrystalline poly(phenylene sulfide) (PPS) has been studied as a function of thermal history using scanning calorimetry, dielectric relaxation, density, and small-angle x-ray scattering (SAXS). Based on the new heat of fusion of perfect crystalline PPS, which is 26.7±0.8 cal/gram, the weight fraction of rigid amorphous phase is shown to be nearly twice as large as previously reported [1]. The mass fraction of the rigid amorphous phase ranges from 0.24 to 0.42 and is dependent upon thermal treatment. We have taken the approach of assuming a three-phase model for the morphology of semicrystalline PPS consisting of crystalline lamellae, mobile amorphous, and rigid amorphous components. Using this three-phase model, we determine that the average density of the rigid amorphous fraction is 1.325 g/cc, which is slightly larger than the density of the mobile amorphous phase fraction and was insensitive to thermal history. From the SAXS long period, the layer thicknesses of the mobile amorphous phase, rigid amorphous phase, and crystal lamellae were estimated. Only the lamellar thickness shows a systematic variation with thermal history, increasing with melt or cold crystallization temperature, or with decreasing cooling rate.