Abstract
We have recently reported six-contact-lead measurements of the zero-field resistive transition of Bi 2Sr 2CaCu 2O 8−y single crystals which showed that the secondary voltage, obtained with a “flux-transformer” electrode geometry, exhibited a peak near the transition. To investigate the effects of sample inhomogeneities on this structure, we report here measurements on two crystals of different quality, as evidenced by the measured c-axis transition widths of 0.6 K and 2.0 K, respectively. Both samples yield a secondary voltage peak near the transition, with the higher quality sample displaying a larger peak. We compare the results to a “resistor” model, representing the samples as anisotropic resistive media, and find good agreement with the data above the transition (T≥T c c). Below the transition, however, the model does not reproduce the behavior observed in both crystals.
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