Abstract
Indium Oxide thin layers were deposited on microscope glass substrates by chemical bath deposition technique from aqueous solutions containing indium chloride and NH3 at 70 and 900C as deposition temperature. Aqueous solution heated for about 45 minutes and kept at 2.5pH. The effects of temperature toward the properties of the thin layers were investigated. The deposited thin layers were characterized with X-ray Diffraction and Scanning Electron Microscopy analysis.
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