Abstract
We have determined the dependence of target-to-substrate angle on the elemental concentration of c-axis YBCO thin films. Away from the standard off-axis position, energy distributions of sputtered elements vary spatially within the sputter plume due to the angular dependence of thermalization. Standard materials characterization techniques and angle-dependent Rutherford Backscattering Spectrometry (RBS) demonstrate that films grown away from the standard off-axis geometry produce bulk Y(123) with modified surface morphology and deposition rate. Several thin film planar tunneling experiments are consistent with a broken-time-reversal symmetry (BTRS) state. To compliment tunneling measurements, we measure electron paramagnetic resonance (EPR) of the near-surface region of YBCO thin films. Preliminary data are consistent with the spontaneous formation of magnetic moments at low temperature.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.