Abstract
We have investigated the effects of texture and interfacial roughness on the exchange anisotropy in NiFe/Cu/NiFe/FeMn spin valves with different buffer layers (no buffer, Cu, or FeMn) on Si(100) or Si(111) substrates by magnetron sputtering. The crystalline structure, surface topology, and exchange anisotropy field (Hex) were characterized. The exchange anisotropy was established all in (111), (200), and (220) textured samples and there was no systematic relationship between the type of texture and Hex. However, it was found that Hex increased as the surface roughness decreased. The results lead us to believe that interfacial roughness rather than crystallographic texture controls the development of the exchange anisotropy.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
