Abstract
ABSTRACTSurface defects both focus the local electric field and enhance its intensity in the vicinity of the defect. Using a finite element model of an inhomogeneous dielectric film, we have examined the relationship between the defect shape and local electric field in the film and defect. We find that raised defect regions that are peaked have the largest local fields while the slope of removed regions has little effect on the field in raised defects. Both peaked and flat surface defects can lead to large enhancements of the local electric field above that predicted by effective medium approximation (EMA) methods.
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