Abstract
In this study, the effects of sulfurization temperature on the properties of thermally evaporated Cu2ZnSnS4 (CZTS) thin films were investigated. Molybdenum (Mo) coated soda lime glass (SLG) was used as substrates and stoichiometric CZTS powder (99.95%) was used as the source material. XRD patterns showed that CZTS were formed with preferential orientations of (112) > (220) > (312) for all the investigated films. The intensity of (112) peak is found increasing until a certain temperature indicating that the highest degree of crystallinity is achieved together with secondary phases such as ZnS and SnS. It was confirmed by raman shift at 338 cm−1 from Raman spectroscopy, scanning electron microscopy (SEM) and atomic force microscopy (AFM) results showed a trend for surface roughness as well as morphology. From Hall effect measurement, all deposited films exhibited p-type conductivity. From UV–vis spectroscopy measurement, the optical band gap of all the films are found in the range of potential absorbers for CZTS based thin film solar cells.
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