Effects of SrTiO3/TiO2 buffer layer on structural and electrical properties of BiFeO3 thin films grown on GaN (0002)

Abstract

BiFeO3(BFO) films were deposited by pulsed laser deposition on GaN(0002)/c-sapphire. X-ray diffraction data show that BFO(111) epitaxial films was deposited on SrTiO3/TiO2 double-layer buffered GaN, compared to the polycrystalline film grown directly on GaN. The epitaxial relationships of BFO film with SrTiO3/TiO2 buffer layers were BFO [11-2](111)//GaN [1-100](0002) as revealed by XRD phi scans. Furthermore, BFO films on SrTiO3/TiO2 buffer exhibited enhanced electric properties compared to these deposited directly on GaN. The remnant polarization was improved about 30% while the leakage current was reduced by nearly three orders of magnitude. The epitaxial growth promoted by the SrTiO3/TiO2 buffer layer is a pivotal parameter in the improved electric properties of BFO films on GaN (0002).