Abstract

As an important part of Micro-Electro-Mechanical systems (MEMS), micro-actuators have a direct impact on the performance of MEMS devices. This paper presents the effects of sidewall inclination of deep reactive ion etching (DRIE) on the performance of U-shaped electrothermal micro-actuators. The electrothermal micro-actuator models with sidewall inclination angles from -5° to 5° are simulated through finite element method (FEM) by ANSYS to study the influences on the output displacement and the highest node temperature. The simulation results show that electrothermal micro-actuator with larger sidewall inclination angle has more displacement deviation. In addition, larger voltage amplifies the deviation of displacement. The highest node temperature decreases with the increase of the sidewall inclination, and the deviation is small.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.