Effects of secondary electrons emitted from surroundings on defect formation in silica glass under γ-ray irradiation

Abstract

We have investigated the effects of secondary electrons and photons emitted from surrounding materials on defect formation in silica glass under γ-ray irradiation. SiO2 (silica) glass plates and those sandwiched in a pair of various material disks (carbon, stainless steel or lead) were irradiated by γ-ray, and the optical absorption spectra (UV–vis spectra) of the silica glass plates before and after the irradiation were examined. UV–vis spectra of the glass plates after the irradiation showed three absorption bands peaked around 2eV, 4eV and 5.8eV being assigned to color centers relate metal impurities (Al and Ge) and oxygen-deficient centers like E′ center, respectively. All three bands were found to grow with γ-ray irradiation dose and saturated at higher doses, and absorbance of the bands at the saturation for the sandwiched glass plates was higher than that for the bare glass plate. Moreover, the saturated absorbance was higher for the glass plate sandwiched with heavier materials. Employing Monte Carlo N-Particle (MCNP) code for the simulation of the photon–electron transport process, enhanced energy deposition and numbers of secondary electrons and photons emitted from sandwiching material disks to a silica glass plate were calculated. The higher deposition energy correlates well to the higher saturated absorbance, indicating that the secondary electrons and photons emitted from the disks clearly enhanced the defect formation in the sandwiched silica glass plates. This suggests the existence of the dose effect above a critical does, i.e. the irradiation with higher dose will result in higher saturated absorbance.