Effects of random shading, phasing errors and element failures on the beampatterns of line and planar arrays

Abstract

The effects of random shading, phasing errors, and element failures on the beampatterns of line and planar arrays are investigated. The results indicate that the effects of element failures and random phasing errors on the beam-pattern are more pronounced than the effect of shading errors. The deep sidelobe level, in both line and planar arrays, is critically affected by random errors which include shading, phasing and element failures. The combined effects of random shading, phase, and element failures on the beampattern of a line array is more dramatic than on the beampattern of a planar array.