Abstract
The aim of this research was to study the effects of plastic film types and film thickness on elemental analysis by portable X-ray fluorescence spectrometer (pXRF). Mylar polyester film with 3.6 μm and 6.0 μm thickness, and 4.0 μm Prolene thin film were used in this study. Five rock samples were prepared by loosed powder method. The pXRF analysis of each plastic films was calibrated and evaluated the method with seven reference materials. The calibrated curves of three films were strongly correlated to referenced values (R2 > 0.95) for Al, Ca, Fe, K, Mn, Si, Sr, Th, Ti, V, Y, Zn and Zr, except for Cu, Nb, Ni, P, U, V and W. The results showed that the pXRF could be used to determine some elements in rock samples and the thickness and types of the analyzed film influenced on the analysis. The element determination using each film required the developed method by calibration curve construction (linear regression of measured values obtained by the pXRF instrument against their certified values). In addition, the results after the recalibration of each film (both Prolene thin film and Mylar polyester film) agreed well.
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