Abstract
In the present work, nano SiO2 has been irradiated by a 2 × 1013 n ⋅cm−2s−1 neutron flux at different times up to 20 h. It has been comparatively analyzed for the frequency dependencies of dielectric loss of the nanomaterial at the initial state and after neutron irradiation. From the analysis results, it is seen that under the influence of neutron flux the dielectric loss of nano SiO2 decreases with increase of neutron flux. Simultaneously, at all temperatures within f(tgδ) = f(f) dependencies there are peaks of more or less extent. The obtained peaks and the mechanism of other effects are identified.
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