Abstract
Radiation damage introduced by the impact of heavy-ion micro-beams has been studied in connection with its effects on single-event transient currents, which are measured by the digitizing sampling method combined with focused ion micro-beams. It is found that the single-event currents decrease with increasing the repetition number of measurements and that there exists a linear relationship between the ion fluence and the reciprocal of the normalized single-event charge. A single-event damage equation is deduced, where the damage constant is proportional to the defect density calculated using either the Kinchin-Pease model or the TRIM code. Experimental techniques are developed to eliminate the effect of radiation damage.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
